Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing
Flying probe Boundary Scan GenRad Teradyne Agilent In-Circuit Test 3070 228x TestStation National Instruments NI Functional Test PCB Testing

Agilent 3070 & Medalist i3070 Series Test Development Services

  • Agilent 3070 (Medalist i3070)Test Set Development

  • 5184 Pin 3070 System with Hybrid 32 Channel Pin Cards

  • Experienced Test Engineering Staff

  • CAD Tools - CAMCAD and C-Link

  • Boundary Scan with InterConnect PLUS

  • Boundary Scan Support with 3rd Party Major Solutions

  • Agilent AwareTest Software Supported

  • ACUGEN Software - PLD/PAL Models

  • Flash and "On Board" Chip Programming

  • Panel Testing with Thru Put Multiplier

  • Combinational Test Programs (In-Circuit/Functional)

  • Brand Name Fixtures

  • Testability Reviews

  • Quality Turn-Key Solution

  • Supporting UNIX or PC Based Testers

Agilent 3070 ICT Test Development Test Programming

                      

Test Programming fixture ICT Agilent 3070 i3070 incircuit test 3070

                              Agilent 3070 Test Development Test Programming

                             Visit the Agilent Website  

 

Customer's References

Just don't take our word for it, here is what some of our customers have said about TTCI's services.

Industrial OEM
       "Your staff met every programming challenge that was asked of them."
Mil/Aero Contractor
       "With limited data, Your team help us maintain our production efforts with out breaking the budget." 
 
Leading Contract Manufacturer
       "Thanks to your flexibility, we were able to switch the test development from a GenRad to our 3070."

 

            When Quality Counts Use
          The Test Connection, Inc.